Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition) COMPUTERS / Languages / XML

Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition) COMPUTERS / Languages / XMLIn this edition, a more detailed overview of the principles of SIMS is given, and of how the development of dual beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. This is an ideal text for final year undergraduates, first year PhD students, and anyone who may be starting out using secondary ion mass spectrometry as part of their research.

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it provides the most comprehensive treatment of the major issues arising out of construction and engineering projects

the essays in this volume stem from a symposium held at the annual meeting of the Society for American Archaeology

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Jointly produced by the Musei Vaticani and Libreria Editrice Vaticana

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James Robertson