An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science ART / Movements / Modernism

Regular price $ 43.68
Tax included. Shipping calculated at checkout.
Description

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science ART / Movements / ModernismThis book highlights the application of Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) for high resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual beam ToF SIMS is used to investigate a range of materials systems and properties.

This interdisciplinary collection highlights the ways in which water is an irreducible part of the way we live

and likely changes of pest and disease threats

This book is a collection of articles focusing on comparative analysis of the development trajectories in the semi-periphery countries of South America and Central and Eastern Europe

which together reveal the effects of future climate variations on cultural heritage

literature and film

putting its conceptual approach into straightforward language while offering more than 50 classroom-ready Framework-based exercises

and since its emergence in the 1970s

and cellular activity of the satellite cell population has been altered

and the United States through a Neoclassical Realist framework and shows how their dynamic has affected the Persian Gulf regional system and its international relations from the 1970s until today

Grazing dairy cattle are exposed to various worm species

Many Twentieth to Twenty-second Dynasty coffins show evidence of reuse from other

Free sample: Introduction – Peter H

Easy Shipping

Quick Dispatch:

Your An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science ART / Movements / Modernism orders ship within 1-2 business days.

Delivery Options:

  • Standard: 3-7 business days
  • Fast: 2-3 business days
  • Express: 1-2 business days

Order Tracking:

You'll receive a tracking link by email once your An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science ART / Movements / Modernism ships.

Need Help?
Questions about An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science ART / Movements / Modernism, sizing, or delivery? We're just an email away.

Live Shipping Estimates:
Enter your location at checkout to see available shipping methods and costs for An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science ART / Movements / Modernism in your area.

Get Shipping Estimates

You may also like

recommand products

{{{showcase_5_name}}}

US$ {{{showcase_5_price}}}

Min. order: 1 piece

{{{showcase_5_star}}} ({{{showcase_5_reviews}}} reviews)

Sold : Login>>

{{{showcase_6_name}}}

US$ {{{showcase_6_price}}}

Min. order: 1 piece

{{{showcase_6_star}}} ({{{showcase_6_reviews}}} reviews)

Sold : Login>>

{{{showcase_7_name}}}

US$ {{{showcase_7_price}}}

Min. order: 1 piece

{{{showcase_7_star}}} ({{{showcase_7_reviews}}} reviews)

Sold : Login>>

{{{showcase_8_name}}}

US$ {{{showcase_8_price}}}

Min. order: 1 piece

{{{showcase_8_star}}} ({{{showcase_8_reviews}}} reviews)

Sold : Login>>

{{{showcase_9_name}}}

US$ {{{showcase_9_price}}}

Min. order: 1 piece

{{{showcase_9_star}}} ({{{showcase_9_reviews}}} reviews)

Sold : Login>>

{{{showcase_10_name}}}

US$ {{{showcase_10_price}}}

Min. order: 1 piece

{{{showcase_10_star}}} ({{{showcase_10_reviews}}} reviews)

Sold : Login>>